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Three-point repositioning of axes: three-dimensional alignment procedure for electron microscope tomography using three markers

  • R. Jonges
  • , E. de Moor
  • , P. N. Boon
  • , J. van Marle
  • , A. J. Dietrich
  • , C. A. Grimbergen

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

A description is given of a new procedure to align series of tilted graphs, made with an electron microscope, for computer tomographic purposes. The procedure uses the coordinates of three projected markers to calculate parameters needed for the reconstruction. To that end the procedure computes the direction of the tilt-axis, the translation and rotation parameters, the tilt-angle of every micrograph, and the spatial coordinates of the individual markers with their centre of gravity as origin of the coordinate system. A searching technique, based on cross-correlation, is described to locate accurately the micrographs markers
Original languageEnglish
Pages (from-to)516-526
JournalMicroscopy research and technique
Volume33
Issue number6
DOIs
Publication statusPublished - 1996

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