Abstract
Background Psychotic experiences (PEs) and social isolation (SI) seem related during early stages of psychosis, but the temporal dynamics between the two are not clear. Literature so far suggests a self-perpetuating cycle wherein momentary increases in PEs lead to social withdrawal, which, subsequently, triggers PEs at a next point in time, especially when SI is associated with increased distress. The current study investigated the daily-life temporal associations between SI and PEs, as well as the role of SI-related and general affective distress in individuals at clinical high risk (CHR) for psychosis. Methods We used experience sampling methodology in a sample of 137 CHR participants. We analyzed the association between SI, PEs, and distress using time-lagged linear mixed-effects models. Results SI did not predict next-moment fluctuations in PEs, or vice versa. Furthermore, although SI-related distress was not predictive of subsequent PEs, general affective distress during SI was a robust predictor of next-moment PEs. Conclusions Our results suggest that SI and PEs are not directly related on a moment-to-moment level, but a negative emotional state when alone does contribute to the risk of PEs. These findings highlight the role of affective wellbeing during early-stage psychosis development.
| Original language | English |
|---|---|
| Pages (from-to) | 1684-1692 |
| Number of pages | 9 |
| Journal | Psychological medicine |
| Volume | 54 |
| Issue number | 8 |
| Early online date | 2024 |
| DOIs | |
| Publication status | Published - 1 Jun 2024 |
Keywords
- clinical high-risk
- distress
- experience sampling methodology
- negative affect
- psychotic experiences
- social isolation
- solitary stress
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