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Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

  • Georgios Ctistis*
  • , Alex Hartsuiker
  • , Edwin Van Der Pol
  • , Julien Claudon
  • , Willem L. Vos
  • , Jean Michel Gérard
  • *Corresponding author for this work
  • University of Twente
  • AMOLF
  • Commissariat à l’énergie atomique et aux énergies alternatives

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1 μm up to 20 μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements.

Original languageEnglish
Article number195330
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume82
Issue number19
DOIs
Publication statusPublished - 29 Nov 2010

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