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A sensitivity analysis of microarray feature selection and classification under measurement noise

  • Herman Sontrop*
  • , René Van den Ham
  • , Perry Moerland
  • , Marcel J. T. Reinders
  • , Wim F. J. Verhaegh
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Microarray experiments typically generate data with a fairly high level of technical noise. Whereas this noise information is sometimes used in tests for differential expression and in clustering tasks, its effect on classification has remained underexposed. In this paper we assess the stability of microarray feature selection and classification under measurement noise. We do so by repeating the experiments many times, using perturbed expression measurements, based on reported uncertainty information. For a well-known study from the literature, the experiments show that the feature selection outcome can vary considerably, and that classification is quite unstable for 7 out of the 106 validation samples, in the sense that over 25% of the perturbations are not assigned to their original class. We also show that classification stability decreases when fewer genes are selected.

Original languageEnglish
Title of host publication2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSIPS 2009
DOIs
Publication statusPublished - 2009
Event2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSIPS 2009 - Minneapolis, MN, United States
Duration: 17 May 200921 May 2009

Publication series

Name2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSIPS 2009

Conference

Conference2009 IEEE International Workshop on Genomic Signal Processing and Statistics, GENSIPS 2009
Country/TerritoryUnited States
CityMinneapolis, MN
Period17/05/200921/05/2009

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