Ossewaarde, R., Jonkers, R.,
Pijnenburg, Y.,
Keulen, A. & Leijnen, S.,
2024,
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc.,
p. 1124-1128 (2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2024 - Proceedings).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review